Figure 3 | Scientific Reports

Figure 3

From: Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction

Figure 3

Texture analysis of 100 µm Ni microwire. (a) Cross-sectional EBSD map (IPF relative to the wire axis); the black dashed circles correspond to the different diameters obtained by electropolishing. (b) (111), (200), (220) pole figures from cross-sectional EBSD. (c) (111), (200), (220) pole figures along wire axis from high-energy X-ray diffraction.

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