Table 1 Characteristics of microwires (a minimum of three wires have been deformed under X-rays: error bars correspond to the data scatter).

From: Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction

Sample ID

Vol. fraction of <111> grains

Vol. fraction of <100> grains

Yield stress (MPa)

Tensile strength (MPa)

Uniform elongation (%)

AA100

0.75

0.25

820 ± 7

885 ± 12

1.2 ± 0.17

EP70

0.83

0.17

850 ± 26

895 ± 30

0.82 ± 0.09

EP50

0.90

0.10

915 ± 90

940 ± 119

0.61 ± 0.07

EP40

0.95

0.05

1050 ± 56

1050 ± 56

0.54 ± 0.08

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