Figure 3 | Scientific Reports

Figure 3

From: Reflective color filter with precise control of the color coordinate achieved by stacking silicon nanowire arrays onto ultrathin optical coatings

Figure 3

(a) Schematic illustration of SMCF with geometrical parameters as follows: D = 110 nm, H = 2 μm, Λ = 1.25 μm, and t = 15 nm. (b) Simulated reflectance spectra of three photonic structures: (1) Si NWA on Ag, (2) a-Si thin film on Ag, and (3) SMCF. Solid and dashed lines indicate that the diffusive and specular reflectance spectra, respectively. (c) Stacked area of light extinction ratio depending on the wavelength. The absorption, which is one type of light extinction, is distinguished with materials such as a-Si, Ag, and Si. (d) 3-dimensional absorption profiles and (e) E-field distributions of SMCF at two resonant wavelengths (i) absorption-based resonance; 483 nm and (ii) scattering-based resonance; 720 nm. The orange arrow indicates the light propagation direction. The detailed description for the scattered E-field simulation is depicted in Methods and Fig. S7.

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