Figure 4 | Scientific Reports

Figure 4

From: Reflective color filter with precise control of the color coordinate achieved by stacking silicon nanowire arrays onto ultrathin optical coatings

Figure 4

The (a) measured and (b) simulated contour plots of the SMCF as functions of the wavelength and the diameter of Si NWA with the change of thickness of a-Si from 10 to25 nm. Dashed lines indicate the resonant wavelengths. (i.e., White line: HE11 mode, green line: HE12 mode, and blue line: interference in a-Si thin film) (c) The color pallet with the photographs of the fabricated SMCF depending on the thickness and diameter of a-Si and Si NWA, respectively. (d,e) HSV (i.e., Hue, Saturation, and Value) of SMCF on a-Si optical coating with different thicknesses (i.e., 10, 15, 20, and 25 nm). (d) The top view of HSV representing Hue and Saturation values. The symbol of ‘Star’ marks the color representation of only a-Si optical coating. (e) The Value information of the SMCF as a function of the diameter and on thickness of Si NWA and a-Si optical coating, respectively.

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