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Figure 2

From: Perovskite ferroelectric tuned by thermal strain

Figure 2

XRD analysis. (a) Details of the Θ-2Θ scans around the (004) perovskite diffraction peaks in the 100-nm-thick BTO films on STO and SRO-coated STO. Diffractions from the BTO films, substrates, and SRO are marked by “f”, “s”, and “e”, correspondingly. (b) Reciprocal space map around (103) perovskite diffraction in the BTO/SRO/STO stack. (c) Lattice parameters as a function of temperature in the BTO film on STO and in the STO substrate.

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