Figure 4
From: Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector
Information strength in the spatial frequency domain. (a–c) Amplitude of diffraction patterns calculated from the reconstructed phases shown in Fig. 3(a–c), respectively. (d) Amplitude of typical raw diffraction pattern acquired at 2 ms. (e–h) Enlarged regions extracted from the areas in (a–d) indicated with a purple square. (i–l) Enlarged regions extracted from the areas in (a–d) indicated with a red square. Contrast is boosted to show the low signal reflections (i.e. (210) in (e)). The scale bar applied to (a–d) is 20 mrad.
