Figure 2
From: Eutectic modification by ternary compound cluster formation in Al-Si alloys
Inverse pole figures of EBSD maps in Al-5 wt.%Si alloys modified by: (a) Eu (step size 30 nm) and (d) Yb (step size 90 nm). Black lines show twin boundaries in Si. White areas correspond to the Al matrix which was filtered out for clarity. TEM images show high density of crystallographic defects in the Si structure of the Eu modified alloy (b,c); and only flat twin planes across the Si crystal in the alloy with Yb addition (e,f).
