Figure 3
(a) Emitted photons (per incident protons) for an incident angle of 60° with respect to the surface for a SiO2 material sample; the incident proton energy is 3 MeV and its number 106 protons; (b) Emitted photons (per incident protons) for different incident angles (30° and 90°) with respect to the surface for a SiO2 material sample, for an incident proton energy of 3 MeV and using 106 protons; (c) Emitted photons (per incident protons) for a fixed incident angle of 30° with respect to the surface, for different incident proton energies and 106 protons. Within each photon energy bin (respectively for figure (a) 0.25 keV, (b,c) 0.5 keV), the figure displays the contribution made by the different proton energies. NB related to the panels b and c, considering protons with 3 MeV and 30° incidence: The data refer to two different Monte Carlo simulations, with different random conditions. In particular, the calculations of the bremsstrahlung, the secondary processes and emissions are based on randomly generated information in the algorithms that can produce fluctuations in the results.
