Figure 5
From: Short range biaxial strain relief mechanism within epitaxially grown BiFeO3
(a) A cross-sectional BF TEM image of BFO layer grown on YAO substrate along [010]YAO zone axis. The contrasts due to low-angle grainboundaries are denoted with arrows. The area with high density of dislocations is indicated by blue lines. The NBED patterns from BFO and YAO are shown as (b) and (c), respectively. Note that the red arrows in (c) indicate the reflections caused by double diffraction.
