Figure 6
From: Short range biaxial strain relief mechanism within epitaxially grown BiFeO3
(a) A cross-sectional BF TEM image of BFO layer grown on YAO substrate along [001]YAO zone axis. The NBED patterns from BFO, YAO, and the BFO/YAO interface are shown as (b–d) respectively. The structure factor calculation for the BFO/YAO interface is shown in (e) by using unstrained BFO and YAO materials. Note that the Bragg’s reflections denoted by red arrows are resulting from double diffraction.
