Figure 2

Virtual multi-alignment method for an elastic specimen combined by two different elastic sections. When two different types of elastic sections are contracted during scanning, mathematical modifications cannot produce an ideal sinogram pattern as a whole. (a) The process of deformation of two elastic sections during scanning. The structure of the image specimen was captured at different projection angles (0°, 89.85°, 179.85°; top left, right and bottom left, respectively). In the bottom right panel, the elliptic section contracts with reduction rates of 0.036% in the horizontal direction and 0.054% in the vertical direction, and the regular section contracts with a reduction rate of 0.054%. (b) Sinograms in the process of deformation. The amplitude of the sinogram gradually decreases with respect to the projection angle. After converting the left sinogram to a rigid-type sinogram, the change in the projection angle will become constant 0.15°. In the right sinogram, the projection angle consistently changed by 0.15° based on the X-ray microtomography beamline at the National Synchrotron Light Source. (c) For each section, we used the VAM and rigid-type conversion to satisfy the ideal sinogram pattern. (d) Locally aligned reconstructions from the sinograms of (c); the elliptic section (left) and regular section (right). (e) Multi-aligned reconstruction combining the locally aligned reconstructed sections from (d) using the region of interest of each section.