Figure 3
From: Microstructural deformation process of shock-compressed polycrystalline aluminum
Estimation of shock pressure from the strain. (a) X-ray diffraction profiles of the 111 and 200 aluminum peaks at ambient pressure (black curves) and at delay times of −3, 0, 3 and 6 ns (red curves). The maximum peak shift is at 3 ns with a peak lattice strain \(\epsilon \) = −0.02. These diffraction profiles were averaged from 25 diffraction images taken from different targets. (b) Example Velocimetery interferometer systems for any reflector (VISAR) trace for the same experimental conditions as the time-resolved X-ray diffraction measurement. This velocity profile is from the free-surface of the polycrystalline aluminum film.
