Figure 5
Calculated XRD pattern of MBI and XRD measurements of BiI3-only film and MBI layers deposited with different MAI/BiI3 ratios (3, 5 and 8), substrate temperature of 88 °C and a BiI3 rate of 0.5 nm/min.
Figure 5 | Scientific Reports
Calculated XRD pattern of MBI and XRD measurements of BiI3-only film and MBI layers deposited with different MAI/BiI3 ratios (3, 5 and 8), substrate temperature of 88 °C and a BiI3 rate of 0.5 nm/min.
