Figure 2

(a) Raman spectra from two different few-layer α-In₂Te₃ both with typical three Raman peaks at 125, 141 and 182 cm⁻¹; (b) X-ray diffraction result from a typical α-In₂Te₃ film from different spots in the same sample. XPS spectra of (c) In 3d and (d) Te 3d levels in few-layer α-In₂Te₃.