Figure 3
From: Photocapacitive CdS/WOx nanostructures for solar energy storage
XPS measurements from the CdS sample over the range 0–1200 eV (a), in addition to higher-resolution measurements of the Cd 3d (b), S 2p (c), O 1 s (d) and C 1 s (e) photoelectron peaks and the Cd MNN Auger spectrum (f). The secondary electron background of each photoelectron peak is modelled by a Shirley-type function, plotted in each case as a dashed black line, while the peaks themselves are deconvoluted into Gaussian-Lorentzian components, depicted as solid coloured lines, with components within the same peak doublet assigned the same colour.
