Figure 6
From: Bulk superconductivity in a four-layer-type Bi-based compound La2O2Bi3Ag0.6Sn0.4S5.7Se0.3
X-ray diffraction analysis for La2O2Bi3Ag0.6Sn0.4S5.7Se0.3. XRD pattern and the Rietveld refinement result are shown. The arrows indicate the peaks for the impurity phase La2Sn2O7. The inset image shows the crystal structure depicted using the structural parameters obtained from the Rietveld refinement.
