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Figure 1

From: On the emergence of conductivity at SrTiO3-based oxide interfaces – an in-situ study

Figure 1

In-situ measurements of the interfacial sheet resistance during the deposition. (a) Schematic illustration of the in-situ transport measurement system in the PLD chamber. (b) Interface sheet resistance as a function of thickness for LAO/STO and GAO/STO measured in-situ and ex-situ. The ex-situ measurements were taken from23 with comparable deposition conditions, we note that the critical thickness, especially for GAO, does change with the deposition conditions23.

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