Figure 2
From: Plasmonics of Diffused Silver Nanoparticles in Silver/Nitride Optical Thin Films
ToF-SIMS profile with analysis for samples S2–S6. (a,d,g,j) The depth profiles of the relevant ion species. To minimize the visual impact of Ag peaks due to interface artefacts, the ion counts above 1000 are in log scale. (b,c,e,f,h,i,k,l) The regression fits to the (b,e,h,k) Ag ion counts and (c,f,i,l) to the Al ion counts, with an erfc model.
