Figure 3
From: Plasmonics of Diffused Silver Nanoparticles in Silver/Nitride Optical Thin Films
XPS Data for Sample S6. (a) XPS depth profile of atomic concentration (b) XPS binding energies for the silver 3d3/2 and 3d5/2 peaks at selected depths. 1297s is within the top AlN layer, 3892s is within the silver film, and 4818s is within the seed AlN layer, close to the silver interface. The analytical probe includes contribution of signals from the top 8–10 nm of the bottom of the sputter crater. Convoluted with this are sputtering effects.
