Figure 3 | Scientific Reports

Figure 3

From: Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

Figure 3

Multidimensional representation of correlated microscopy sets. Recording a complete set of force curves enables the calculation of the sample topography within the range of pre-defined force setpoint and reconstruct the surface structure of the cells. The overlay at 300 pN with the SR-SIM channel is given for consideration of the spatial overlay accuracy. XY-scales of the AFM renders are 20.74 μm and 10.37 μm respectively, recorded at a resolution of 256 × 128 pixels. SR-SIM images were obtained using NIS-Elements (v5.11.00), while the overlay of the SR-SIM and AFM data were generated with the JPK Data Processing software (v6.1.120).

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