Figure 6
Analysis of the influence of embossing on the scattering contrast. (a) DFI-signal of samples A, B and C in an applied magnetic field Ha = 3330Am−1. The data is normalized using the reference sample also exposed to Ha. A signal smaller than S = 1 indicates more scattering in the embossed sample than in the non-embossed reference. (b) Normalized signal Save (r) as obtained by radially averaging the images of samples A (blue), B (orange), and C (green) exposed to two different magnetic fields.
