Figure 3 | Scientific Reports

Figure 3

From: AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

Figure 3

Comparison of alignments by SIFT, TM, and AMST using the proposed evaluation scheme, namely comparison to local SIFT alignments on the HeLa dataset (EMPIAR-10311). (a) Image slice which is located in the center of the resliced crops of (b). (b) Evaluations of the different alignment methods. The microscopy images are resliced crops (zy) along the respective dashed line indicated in (a). The plots show the displacements an alignment by SIFT performs when run on the areas as indicated by the boxes in (a). The distinct regions and their respective displacements are color coded: blue denotes the top part of the dataset, yellow the bottom. The peaks in the alignment error plots for SIFT and TM originate from auto-focus and -stigmation operations during image acquisition. (c) Comparison of the AMST and SIFT alignments to show the bias of SIFT along the z-axis on the morphology of the sample. (d) Comparison of the AMST and TM alignments showing the preservation of the overall morphological structures and the efficacy in correcting for the local image deformations. The inset highlights the difference of the alignments with respect to the maintenance of smooth membranes.

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