Figure 3
Crystallographic characterization of two as grown CoSi crystallites with different absolute structures: (top) mean value rm = ½ (r+E + r−E) of cross correlation coefficients r+E, r−E that measure the coincidence between images of measured EBSD pattern and simulated pattern of both enantiomorphs (inset: experimental Kikuchi pattern); (bottom) difference Δr = (r+E – r−E) of cross correlation coefficient. The sign of Δr is connected to the absolute structure due to the better coincidence between its simulated pattern and the experimental pattern ((+)…A-form; (−)…B-form); insets: FIB specimens used for X-ray diffraction measurements, before liftout.
