Figure 1
From: First-Principles Predictions and Synthesis of B50C2 by Chemical Vapor Deposition
(Upper) Glancing angle x-ray diffraction of B50C2 grown at 750 °C on silicon substrate. The X-ray wavelength corresponds to Cu K-α emission (λ = 1.54187 Å). The red curve is the raw data and the blue curve is the Rietveld refinement with lattice parameters listed in Table 1.
