Figure 5
The inset in (a) is the microscope image of a GeSn stripe, which is milled by FIB along the black line to expose the axial cross-section for further characterization, (a,f) are the TEM image and EDS element mapping of the above mentioned cross-section, respectively. (b) Magnified TEM image of interfacial area between the GeSn stripe and Ge buffer. (c1) The HRTEM image of the GeSn stripe surface, with its SAED pattern shown in (c2). (d1) The HRTEM image of the interface between GeSn stripe and Ge buffer, with its SAED pattern shown in (d2). (e1) The HRTEM image of interfacial area between Sn droplet and GeSn stripe, with its SAED pattern shown in (e2).
