Figure 12
From: Ultra-Fast High-Precision Metallic Nanoparticle Synthesis using Laser-Accelerated Protons
AFM and EDX analysis under SEM conditions for the aluminum and copper targets. (a) AFM image of a NP layer obtained using an aluminum proton-irradiated sample, at a distance of 2 cm from the particle source. The analyzed zone on the glass is at a 250 μm radial distance from the plume border. (b) EDX spectrum of the deposited aluminum layer, taken under SEM conditions. The peak at ∼ 1.5 keV indicates the K-alpha emission of aluminum. There are no significant signatures of other materials. (c) AFM image of a NP layer obtained using a copper proton-irradiated sample, at a distance of 2 cm from the particle source. The analyzed zone on the glass is at a 250 μm radial distance from the plume border. (d) EDX spectrum of the deposited copper layer, taken under SEM conditions. The peak at ∼ 0.9 keV indicates the L-alpha emission of Copper. There is a peak, significantly lower compared to the L-alpha peak of Copper, at ∼2.1 keV indicating the presence of gold in the deposited layer. This is likely due to the debris coming from the proton source that slightly contaminates the irradiated material sample.
