Figure 2
A dual XRF + STXM setup (a) allows for using the fast STXM modality (b) (80 µm × 80 µm, 50 × 50 pixels, 20 ms dwell time/pixel, scale bar = 20 µm) as a decision factor for performing a slower XRF acquisition (d). The scan positions in red (c) are above a transmission threshold resulting to a fast 66% sub-sampled XRF acquisition (d). The in-painting reconstruction (f) of the sparse map (d) is comparable to a slow full acquisition (e). In this case Panels c, d and f show Si XRF signal collected at 1.95 keV on a soybean root section over an area of 80 µm × 80 µm, with 1.6 µm step size and 3 s acquisition time/pixel.
