Figure 5 | Scientific Reports

Figure 5

From: Exploiting defective RRAM array as synapses of HTM spatial pooler with boost-factor adjustment scheme for defect-tolerant neuromorphic systems

Figure 5

(a) The relationship of log (RLRS) and probability density (%) with log-normal distribution. Here the number of samples measured is 100 (%). (b) The relationship of log (RHRS) and probability density (%) with log-normal distribution. Here the number of samples measured is 100. (c) The failure map of the non-ideal 400 × 256 crossbar array consisting of the obtained RLRS and RHRS. The defective devices were randomly distributed and the failure percentage of the RRAM was assumed 10%.

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