Figure 6
From: Nano-scale depth-varying recrystallization of oblique Ar+ sputtered Si(111) layers
Raman spectra corresponding to Ar+ amorphized and annealed samples as a function of off-normal incidence.
Figure 6 | Scientific Reports
From: Nano-scale depth-varying recrystallization of oblique Ar+ sputtered Si(111) layers
Raman spectra corresponding to Ar+ amorphized and annealed samples as a function of off-normal incidence.
