Figure 9

Same as Fig. 8 but for semiconductor-based designs. (a) Controllability factor CF as a function of the physical thickness h—the optimal regimes are denoted by red dots. (b) Variation of controllability factor CF with respect to optical axis tilt \(\varphi\) and the duty cycle r for amorphous-silicon-based multilayers (\(CF\cong 75\%\))—the optimal regimes are denoted by black \(\times\). (c) Same as (b) for InAs-based multilayers (\(CF\cong 73\%\)).