Figure 5

(a) XRD profile of the heat-treated Al/GaN sample at 1573 K for 3 h together with bare GaN and Al/GaN samples before heat treatment, (b) ϕ-scans of AlN {10–12} and GaN {10–12} for the Al/GaN sample after heat treatment at 1573 K for 3 h.

(a) XRD profile of the heat-treated Al/GaN sample at 1573 K for 3 h together with bare GaN and Al/GaN samples before heat treatment, (b) ϕ-scans of AlN {10–12} and GaN {10–12} for the Al/GaN sample after heat treatment at 1573 K for 3 h.