Figure 1 | Scientific Reports

Figure 1

From: An approach for the measurement of the bulk temperature of single crystal diamond using an X-ray free electron laser

Figure 1

Sketch of the experimental setup used to perform millielectronvolt inelastic X-ray scattering at the HED end-station at the European XFEL44, following the proof of principle of McBride et al. 5. Incident X-ray pulses at \(7{,}492\;\mathrm{eV}\) are first monochromatised using a succession of two double-bounce silicon monochromators arranged in a dispersive configuration. Monochromatised X-ray pulses are then incident on a diamond sample oriented such that the scattering vector \(\vec {Q}\) is parallel to the [100] crystallographic direction of diamond. The inset shows a side view of the experimental configuration with the orientation of the different parts. Scattered photons are finally collected by the three diced silicon analysers and finally focused on an ePIX100 detector48.

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