Figure 6 | Scientific Reports

Figure 6

From: Bidirectional-nonlinear threshold switching behaviors and thermally robust stability of ZnTe selectors by nitrogen annealing

Figure 6

XRD patterns of ZnTe layers annealed in (a) vacuum and (b) nitrogen atmospheres. The vacuum-annealed ZnTe layer at more than 250 ℃ gives the presence of Te peaks (red), possibly arising from a phase separation event of the ZnTe layer during vacuum annealing. The presence of phase-separated Te peaks may be highly associated with the electrical degradation observed from the higher annealing temperature over 250 ℃ while the nitrogen-annealed ZnTe layer refers to thermally robust and stable patterns associated with having no phase separation characteristics.

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