Figure 7
XPS analysis on pristine and annealed ZnTe layer. (a–c) XPS measurements of Te 3d5/2 signals. (d–f) XPS measurements of Zn 2p3/2 data. The proper N2 annealing approach maintains the pre-existing defect-related Te2+ peaks of Sample A while the vacuum-annealing one causes a significant variation in Te2+ peaks initially associated with the TS behaviors. No clear variation is detected in Zn-related peaks, which imply that Zn component is not related to the TS behaviors.
