Figure 3
From: Mirror effect in atomic force microscopy profiles enables tip reconstruction
Numerical simulation of profiles from a narrow (a) and a broad (b) rectangular object (calculations were made using software in Ref.13). Different tip shapes are considered: sharp (black line), round (red line) and flat (blue line). Because of the rectangular geometry, the same profile is obtained after removing section A–B. In addition, the remaining profile fits the corresponding inverted tip-shape giving place to the “mirror effect”. In (c) we illustrate an AFM probe with typical tip parameters such as γ (tip-to-face angle) and rtip, scanning a rectangular object.
