Figure 4
From: Mirror effect in atomic force microscopy profiles enables tip reconstruction
(a) AFM image of a representative area of the NPs sample under study. Few profiles can be measured in each image if focusing on isolated NPs with regular shape and avoiding aggregates. (b) Profiles of different height exhibiting a progressive experimental width reduction. (c) height-to-width plot generated with data from 46 NPs in three different images. The red line corresponds to the best fitting to Eq. (1).
