Figure 3
Design trend simulations for most influential system parameters. (a–c) Calculated complex reflection coefficient as a function of dimensions of the shorter nanobrick, with color maps representing reflection coefficient amplitude and contours representing reflected phase for normal incident TM polarized light. The separation between phase contours is \({60}^\circ\), and the following values are implemented for system parameters not being investigated: \(P_x=P_y={330}\,\hbox {nm}\), \(t_m = t_s = {70}\,\hbox {nm}\), \(d_x={90}\,\hbox {nm},\; t_b=g={50}\,\hbox {nm}\), \(\lambda _0={900}\,\hbox {nm}\). Investigation of the influence on the phase-amplitude map by variation of (a) the spacer thickness (\(t_s=50,\;70,\;{90}\,\hbox {nm}\)), (b) the nanobrick thickness (\(t_b=35,\;50,\;{65}\,\hbox {nm}\)), and (c) the difference in nanobrick length (\(d_x=75,\;90,\;{105}\,\hbox {nm}\)).
