Figure 4
Current normalized to the value measured at RT as function of temperature for different applied voltages of a 25 nm thick sample. The sawtooth-like shape of curves at high voltages is due to switching events.
Figure 4 | Scientific Reports
Current normalized to the value measured at RT as function of temperature for different applied voltages of a 25 nm thick sample. The sawtooth-like shape of curves at high voltages is due to switching events.
