Figure 8
Raman analysis of as-deposited and annealed films. (a) Raman spectra of as-deposited and annealed samples prepared with pre-annealing conditions of \(250\,^{\circ }\hbox {C}\), \(350\,^{\circ }\hbox {C}\), and \(450\,^{\circ }\hbox {C}\) for 30 s. The characteristic CZTS peaks are marked, as well as the position of the \(\hbox {Cu}_{2-x}\hbox {S}\) phase. (b) Cross-section SEM images of as-deposited films.
