Figure 5

(a) Cross-sectional transmission electron microscopy (TEM) images of the Au-FEP interface with respect to plasma treatment time. The FEP was plasma treated at an RF power of 40Â W, and Au was deposited at an RF sputtering power of 50Â W. (b) Cross-sectional STEM images of the Au-FEP, Au-PFA, and Au-PTFE interfaces. Fluoropolymers did not undergo plasma treatment, and Au was deposited at an RF sputtering power of 50Â W. (c) Cross-sectional STEM images of an Au-FEP interface with respect to the RF sputtering power. All images are of a 127-Îĵm thick FEP film.