Figure 4 | Scientific Reports

Figure 4

From: Genome-wide association studies in tropical maize germplasm reveal novel and known genomic regions for resistance to Northern corn leaf blight

Figure 4

Inflation depicted by Q–Q plots of observed versus expected -log10 (P values) plots for NCLB using the naïve association model (G-test), GLM (G + Q) and MLM (G + Q + K); G = genotype (fixed), Q = ten principal components (fixed), K = kinship matrix (random) for (a) CAAM panel (b) DTMA panel and (c) IMAS panel; Highly significant SNPs identified from MLM model using Manhattan plot (d), plotted with the individual SNPs on the X-axis and − log10 P value of each SNP on the Y-axis for the three panels, CAAM, IMAS and DTMA. The horizontal line shows the cut off P value and the vertical lines represent the common haplotypes identified in haplotype regression analysis across different panels for NCLB resistance.

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