Table 6 A comparison of thicknesses obtained from ellipsometry and optical transmission measurements.

From: Optical and surface energy probe of Hamaker constant in copper oxide thin films for NEMS and MEMS stiction control applications

Power (W)

Power density (W/cm2)

Pressure (mTorr)

Oxygen flow (sccm)

Thickness (nm) [ellipsometry]

Thickness (nm)

[transmission]

200

0.6

3.0

2.0

73.43

73.55

300

0.9

4.0

4.0

102.07

101.23

400

1.2

4.0

6.0

146.21

140.27

500

1.5

4.0

6.0

256.03

268.38

600

1.9

3.0

6.0

228.42

228.89