Figure 8
Images captured by the CCD of the white screen when an image of the 1951 USAF target is generated without (a) and with (b) a chiral nematic LC device (E7 + 4.7 wt% BDH1281, pitch = 310 nm). (c) Image showing that the resolution is preserved during the speckle reduction process. The left-hand and right-hand images show the speckle pattern for the case when the LC speckle reducer is switched off or on, respectively. An image of a microscope stage micrometer can be seen showing a scale bar from 0 to 100 µm. The device thickness was nominally 20 µm and measurements were carried out at T = 25 °C.
