Figure 1
From: Electrical transport properties and Kondo effect in La1−xPrxNiO3−δ thin films
(a) X-ray scattering patterns for LPNO films scanned along the (00l) direction. (b) The c lattice constant as a function of the Pr concentration, estimated by X-ray scattering. (c) H scan from (0.9 0 L) to (1.1 0 L), where L is the L position of the film peak. (d) Reciprocal space mapping (RSM) around the (103) Bragg peak for the sample with x = 0.2.
