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Figure 1

From: High Jc and low anisotropy of hydrogen doped NdFeAsO superconducting thin film

Figure 1

Microstructural analysis by TEM. (a) TEM cross-sectional view of the NdFeAs(O,H) epitaxial thin film revealed almost no apparent defects. Additionally, no reaction layer between the film and the MgO substrate was observed. (b) The magnified ADF images of NdFeAsO and (c) NdFeAs(O,H). (d) Image intensity profiles along the c-axis direction extracted from (b) and (c), averaged in the a-axis direction. The c-axis lattice parameters averaged over 10 layers are 8.64 Å and 8.50 Å, respectively. The distances from the 1st to the 11th layer and from the 18th to the 28th layer are the same in the NdFeAs(O,H) film.

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