Figure 1

AFM topography images of GaAs islands grown on the GaAs(111)A substrate at (a) \(300\,^{\circ }\hbox {C}\) (\(1\times 1\,\upmu \hbox {m}^{2}\), sample T1); (b) \(350\,^{\circ }\hbox {C}\) (\(1\times 1\,\upmu \hbox {m}^{2}\), sample T2); (c) \(400\,^{\circ }\hbox {C}\) (\(1\times 1\,\upmu \hbox {m}^{2}\), sample T3); (d) \(450\,^{\circ }\hbox {C}\) (\(1\times 1\,\upmu \hbox {m}^{2}\), sample T4). The red circle highlights a kinked island.