Figure 3

(a) XPS survey scan spectrum and high-resolution (b) Pd \(\hbox {3d}_{5/2}\) and \(\hbox {3d}_{3/2}\), (c) Si 2p and (d) Fe \(\hbox {2p}_{3/2}\) and \(\hbox {2p}_{\frac {1}{2}}\) of Fe3O4@SiO2/Pd0/PdIINP (5).

(a) XPS survey scan spectrum and high-resolution (b) Pd \(\hbox {3d}_{5/2}\) and \(\hbox {3d}_{3/2}\), (c) Si 2p and (d) Fe \(\hbox {2p}_{3/2}\) and \(\hbox {2p}_{\frac {1}{2}}\) of Fe3O4@SiO2/Pd0/PdIINP (5).