Figure 4
(a) Resistivity of the P1 thin films on glass substrates obtained by the different preparation methods. The resistivity was measured after annealing at various process temperatures in Ar-H2 (4% H2) for 1 h. SEM images of the surfaces of the P1 thin films on glass substrates prepared by the (b) mist deposition (c) spray coating, (d) bar coating, (e) spin coating, and (f) drop casting methods. These images were taken after annealing at 150 °C. The insets in (b)–(f) are close-up images of the surfaces. The scale bar shown in (b) is common to all images.
