Figure 2

(a) Room temperature XRD pattern of \({\text {Pr}}_2 {\text {CoSi}}_3\). Inset of (a) shows the presence of secondary phase \({\text {PrCoSi}}_2\) in \({\text {Pr}}_2 {\text {CoSi}}_3\). (b) The XRD patterns of \({\text {Pr}}_2 {\text {Co}}_{0.86} {\text {Si}}_{2.88}\) at \(T = 300 \, \text {K}\) (top) and \(T = 15\, \text {K}\) (bottom) along with full-Rietveld analysis. Inset of (top) presents the major peak associated with the superstructure of \({\text {AlB}}_2\)-type structure. Inset of (bottom) presents the temperature dependence of unit-cell volume along with fit using Eq. (1). Estimated errors are smaller than the symbol size.