Figure 5
From: Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media
A schematic representation of the sampled with mixed particles (a). In (b) a vertical cross section through the absorption dataset is given, the vertical line in the center is due to ring artifacts. The proposed procedure derives an AFS value per segmented particle (c). These AFS values are then clustered to classify the 150 nm particles (yellow) from the 50 nm particles (blue) (d).
